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晶体管的某种特性曲线比晶体管的有关参数更能全面地表达其电性能。事实上,参数只是曲线上的一点,当测试条件改变时,参数就要改变。当需要绘出某个晶体管的特性曲线,以便进行挑选、搭配或分析故障时,用专用的晶体管特性曲线图示器或描绘器是最方便的。在没有上述设备时,就不得不用二个或三个万用表搭配起临时的线路。但这样测绘时每一点都要记下两个以上的指示值并标记到座标中,实际操作是很吃力的。下面介绍用一个万用表测绘曲线的办法,测绘时比上一个办法省力得多,线路也简单。缺点是串联电阻大时读数困难,读数误差较大。
Transistor characteristics of a curve than the relevant parameters of the transistor more fully express their electrical properties. In fact, the parameter is just a point on the curve, and the parameters change as the test conditions change. When it is necessary to plot the characteristic of a transistor for the purpose of picking, collocating or analyzing the fault, it is most convenient to use a dedicated transistor profile graph or plotter. In the absence of these devices, you have to use two or three multimeter with temporary lines. However, when mapping at this point, each point should be noted for more than two indicators and marked into the coordinates, the actual operation is very difficult. The following describes the use of a multimeter mapping curve approach, mapping a lot more effort than the previous method, the line is also simple. The disadvantage is that when reading the series resistance is difficult, the reading error is larger.