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文章给出了一阶布尔差分的几种求法，并对这几种方法进了分析、比较，进而通过具体逻辑电路阐述如何用布尔差分及其性质迅速求出逻辑电路的单故障测试集。
In this paper, we give some methods to find the first-order Boolean difference, analyze and compare these methods, and then explain how to find the single-fault test set of the logic circuit by Boolean difference and its properties through the concrete logic circuit.